Characterizing thin-films
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• Ellipsometry
Ellipsometry uses focused light usually from two or more lasers operating at different wavelengths to examine the thickness and dielectric constant of materials comprising our thin -films. If the dielectric constant of the material is known, the technique can be used to characterize the nature of the pores in the material and to probe the dielectric properties of fluids in these pores.
Department of Environmental Chemistry and Technology, University of Wisconsin-Madison
660 North Park Street, Madison, WI 53706
contact us I +1-608-262-2674 I +1-608-446-8160 (cellular)
Professor Marc A. Anderson Lab of Sol-Gel Chemistry
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